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GLVLSI
2002
IEEE
136views VLSI» more  GLVLSI 2002»
15 years 11 months ago
Test generation for resistive opens in CMOS
This paper develops new techniques for detecting both stuck-open faults and resistive open faults, which result in increased delays along some paths. The improved detection of CMO...
Arun Krishnamachary, Jacob A. Abraham