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142

ICCAD
1995
IEEE

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Impulse response fault model and fault extraction for functional level analog circuit diagnosis

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Impulse response fault model and fault extraction for functional level analog circuit diagnosis

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Chauchin Su, Shenshung Chiang, Shyh-Jye Jou

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Added	26 Aug 2010
Updated	26 Aug 2010
Type	Conference
Year	1995
Where	ICCAD
Authors	Chauchin Su, Shenshung Chiang, Shyh-Jye Jou

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